Instrument News
ICP-OES Interfering Element Correction Made Easy
Teledyne Leeman Labs hosted a complimentary webinar on October 12th titled ICP-OES Interfering Element Correction Made Easy.
This webinar highlighted the features of an ICP-OES that allow users to easily identify and correct interfering elements.
• Determination if interferences are present - Partial Overlap - Direct Overlap - Background
• Identify interference(s)
• Select interferent wavelength
• Determine IEC factor
The webinar was presented by Manny Almeida, Teledyne Leeman Labs ICP Product Line Manager.
To view the webinar visit: http://info.teledyneleemanlabs.com/webinar_icp-oes_interfering_element
www.geicp.com Glass Expansion Newsletter | Issue 44 5
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