NEWS INSTRUMENT NEWS From Agilent Technologies - New 4210 MP-AES Eliminate the cost of expensive gases. The new Agilent 4210 microwave plasmaatomic emission spectrometer runs on air rather than flammable gas—a feature unique to Agilent MP-AES systems—making it both safer and less expensive to operate. This is especially important to laboratories in the food, agriculture, petrochemical, environmental and mining industries. The 4210 features an array of optional accessories which extend the instrument’s analytical performance, sample throughput, and ease of use. In addition, new automation software enables remote elemental analysis. This flexibility opens up new possibilities for applications such as at-site process stream monitoring and environmental monitoring. If you want more information, please visit us here. From Analytik Jena - PlasmaQuant® PQ 9000 – A New Perspective of Plasma Observation in ICP-OES A novelty in High-Resolution (HR) atomic spectrometry, the Dual View PLUS plasma observation of Analytik Jena’s PlasmaQuant® PQ 9000 is now bringing state-of-theart productivity and operator convenience to the most elaborate HR ICP-OES routines. Probing an analytically superior vertical plasma by end-on and side-on observation with complementary attenuation of both the axial and the radial view, respectively, Dual View PLUS reaches well-beyond traditional boundaries of ICP-OES and thus takes ultra-trace detection capabilities, linear dynamic working ranges as well as the overall signal stabilities, a major step ahead. Its fast adaptation of plasma views to the required sensitivities and working ranges ensures supreme operator flexibility at compatible speed and sample costs. Dual View PLUS means free selection of 2+2 plasma views in every routine and stands for instrumental flexibility instead of lengthy sample preparation. Look forward to the most sensitive axial plasma views on the market: That of PlasmaQuant® PQ 9000 series! From Horiba Jobin Yvon - New ICP-NEO Software facilitates method development, sample measurement and results management. HORIBA Scientific announces its newest software release for its ICP-OES spectrometers. ICP-NEO is designed to facilitate method development, sample measurement and results management. ICP-NEO includes powerful tools for sample measurement with advanced quality control protocols and retrospective analysis with respect of the integrity of raw results to match with good laboratory practice requirements. The ICP-NEO interface offers a multiple user capability with individual passwords, logoff and logon without stopping the sequence, a contextual tool bar to adapt the content with the window selected, user defined window display on the screen and diagnostics with real-time information on instrument. The method development includes a visual display of interference free lines using S3 wavelengths database - unique database specially developed for ICP-OES by HORIBA Scientific. This database gives information not only on wavelengths but also on detection limits and it is the only one to give reliable relative intensities between emission lines. Full automation of the analysis is possible with autosampler, the Smart Rinse feature for automatic monitoring of rinse efficiency between 2 samples, automatic control of the quality with limits on correlation coefficient and the automated Quality Control procedures fully US EPA compliant with ICV, CCV, LCS, Interference check, Paired samples, etc. ICP Neo is available for all of HORIBA Scientific’s Ultima family ICP-OES spectrometers. It is compliant with the latest Microsoft® platform, as well as Windows® 7 and 8. www.geicp.com Glass Expansion Newsletter | Issue 41 7
GE Newsletter October 2016
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