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GE0283 GE Newsletter October 2014

NEWS IN STRUMENT NEWS From Agilent - Agilent Technologies’ New Dual-View Atomic Spectrometer Delivers Unparalleled Performance for Challenging Applications Agilent Technologies, Inc. has reinforced its position as an innovator in atomic spectroscopy with the introduction of the Agilent 5100 Inductively Coupled Plasma – Optical Emission Spectrometer (ICP-OES). The new system enables customers to run samples faster, using less gas and without compromising performance on even the toughest samples. While conventional dual-view systems require up to four sequential measurements per sample, the Agilent 5100 requires only one, thanks to its innovative Dichroic Spectral Combiner and Synchronous Vertical Dual-view technologies. These innovations will enable customers to perform their analyses with greater speed, accuracy and ease, saving them time and money. With the new system, customers will be able take the guesswork out of method development with intuitive ICP Expert software and Dichroic Spectral Combiner technology. They can also capture all wavelengths in one measurement for higher precision without delays. The system’s vertical torch will enable them to measure even the most challenging samples—from high matrix to volatile organic solvents—with a high degree of confidence. The Agilent 5100 is available in three configurations, all featuring a robust vertical torch: • Synchronous Vertical Dual View (SVDV) delivers the fastest analyses and the lowest gas usage. • Vertical Dual View (VDV) offers high throughput and is upgradable on-site to the SVDV configuration if higher throughput is needed. • Radial View (RV) is ideal for labs needing a fast, high-performance radial ICP-OES. www.geicp.com Glass Expansion Newsletter | Issue 35 7


GE0283 GE Newsletter October 2014
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